Article Abstract

Volume 27, No. (4), 2017 (July)
APPRAISAL OF INTERACTION AMONG NIPPING AND CHICKPEA (CICER ARIETINUM L.) GENOTYPES AND THEIR CORRELATED RESPONSE FOR GRAIN YIELD
H. Khan1, R. Gul2, and N. U. Khan2

H. Khan1, R. Gul2, and N. U. Khan2
1, Department of Agronomy, The University of Agriculture, Peshawar
2, Department of Plant Breeding and Genetics, The University of Agriculture, Peshawar

Corresponding Author: drrozinakhan@yahoo.com
DOI: NA
Page Number(s): 1295-1302
Published Online First: August 01, 2017
Publication Date: August 01, 2017
ABSTRACT

Nipping is considered to be the cause of increase in seed yield of chickpea. Whether, either morphs of chickpea (Desi & Kabuli) verify this statement or not, an experiment was carried out using twenty chickpea genotypes (11 Desi & 9 Kabuli) and two treatments (nipped, control). Two nippings were carried out with 20-25 days interval. Data analysis revealed highly significant differences among genotypes, treatments and genotype by nipping interaction for yield and yield attributing traits. Eight genotypes viz, NDC-4-20-3, NIFA-2005, Karak-2, SL-3-15, NKC-5-S-12, Karak-1, NDC-15-1 and SL-3-64 revealed positive response to nipping, which also provides green forage. Whereas, twelve genotypes including 3 Desi and 9 Kabuli genotypes showed disincline to nipping. It is concluded that nipping should not be practised without prior testing of its effect on genotypes.  Moreover, Desi chickpea respond positively as compare to Kabuli chickpea. Seed yield plant-1 showed highly significant and positive genotypic and phenotypic correlation with secondary branches plant-1 (rg = 0.54,rp = 0.46), pods plant-1 (rg = 0.89,rp = 0.83), seeds pod-1 (rg = 0.58,rp = 54), biological yield plant-1 (rg = 0.97,rp = 0.92), 100-seed weight (rg = 0.52,rp = 0.53), suggesting these traits to be used as selection criteria for yield improvement.

Keywords: Chickpea, genotypes, nipping, correlation, yield

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Journal Impact Factor: 0.5 | (JCR Year: 2025) | Cite Score: 1.3

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Print ISSN: 1018-7081

Electronic ISSN: 2309-8694

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